SAE J1879

Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications.

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Standard:
  • J1879
Revised:
  • 2007-10-30
Issuing:
  • Automotive Electronic Systems Reliability Standards
Scope:

This document will primarily address intrinsic reliability of electronic components for use in automotive electronics. Wherepractical, methods of extrinsic reliability detection and prevention will also be addressed. This document primarily dealswith integrated circuit issues, but can easily be adapted for use in discrete or passive component qualification with thegeneration of a list of failure mechanisms relevant to those devices. Component qualification is the main scope of thisdocument. Other procedures addressing extrinsic defects are specifically addressed in the monitoring chapter. Thisdocument is to be used within the context of achieving Zero Defect in component manufacturing and product use.NOTE: The term "shall" indicates a binding requirement.

History:
StandardPublishedRevisionStatus
J1879_2007102007-10-30LatestRevised
J1879_1988101988-10-01HistoricalIssued
AKA:
  • SAE J 1879
Sector:
  • Automotive
Topic:
  • Electrical, Electronics and Avionics
  • Embedded Software
  • Electronic equipment
  • Semiconductor devices
  • Electrical Systems
  • Total Life Cycle management
  • Quality, Reliability and Durability
  • Quality control

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