SAE J2052

Test Device Head Contact Duration Analysis.

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Standard:
  • J2052
Revised:
  • 2005-12-14
Revision:
  • Historical. Access the latest revision: J2052_201101
Issuing:
  • Safety Test Instrumentation Stds Comm
Scope:

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

History:
StandardPublishedRevisionStatus
J2052_2011012011-01-05LatestRevised
J2052_2005122005-12-14HistoricalReaffirmed
J2052_1997121997-12-01HistoricalRevised
J2052_1990031990-03-01HistoricalIssued
AKA:
  • SAE J 2052
Sector:
  • Automotive
Topic:
  • Safety
  • Injuries
  • Anthropometric test devices (ATD)
  • Impact tests
  • Tests and Testing
  • Test equipment and instrumentation

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