SAE J2052
Test Device Head Contact Duration Analysis.
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
History:Standard | Published | Revision | Status |
---|---|---|---|
J2052_201101 | 2011-01-05 | Latest | |
J2052_200512 | 2005-12-14 | Historical | |
J2052_199712 | 1997-12-01 | Historical | |
J2052_199003 | 1990-03-01 | Historical |